Beilstein J. Nanotechnol.2023,14, 1225–1237, doi:10.3762/bjnano.14.101
force microscopy; calibration; drift correction; imagecorrelationfunctions; periodic structures; scanning probe microscopy; Introduction
In science and technology, scanning probe microscopy (SPM) techniques are widely used to study the structure and properties of surfaces and interfaces from the
PDF
Figure 1:
Schematic representation of algorithm I used to determine the drift velocity vd from the distortion...